Structural study of a superlattice Al-Ni-Ru decagonal quasicrystal using high-resolution electron microscopy and a high-angle annular dark-field technique

被引:0
|
作者
Sun, W [1 ]
Hiraga, K [1 ]
机构
[1] Tohoku Univ, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A high-quality superlattice Al-Ni-Ru decagonal quasicrystal with 0.4 nm periodicity, formed in the conventionally solidified Al70Ni20Ru10 alloy, has been studied by high-resolution electron microscopy and a high-angle annular dark-field (Z-contrast) technique. It has been clearly revealed that its structure is characterized as an a periodically ordered arrangement of decagon-shaped atomic columnar clusters which have a diameter of 2 nm and show pentagonal symmetry. On the basis of high-resolution electron microscopy structure images, and the atom-resolution Z-contrast observations which highlight the transition-metal sites, the arrangement of atoms in the superlattice decagonal quasicrystal are proposed.
引用
收藏
页码:187 / 195
页数:9
相关论文
共 50 条
  • [41] Direct imaging of Guinier-Preston zones by high-angle annular detector dark-field scanning transmission electron microscopy
    Konno, TJ
    Kawasaki, M
    Hiraga, K
    JOURNAL OF ELECTRON MICROSCOPY, 2001, 50 (02): : 105 - 111
  • [42] ON THE IMAGE-CONTRAST FROM DISLOCATIONS IN HIGH-ANGLE ANNULAR DARK-FIELD SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    PEROVIC, DD
    HOWIE, A
    ROSSOUW, CJ
    PHILOSOPHICAL MAGAZINE LETTERS, 1993, 67 (04) : 261 - 272
  • [43] The characterisation of ultrathin doping layers in semiconductors using high-angle annular dark-field imaging
    Liu, CP
    Boothroyd, CB
    Brown, PD
    Humphreys, CJ
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1997, 1997, (157): : 67 - 70
  • [44] Three-dimensional analysis of platinum supercrystals by transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy observations
    Yamasaki, J
    Tanaka, N
    Baba, N
    Kakibayashi, H
    Terasaki, O
    PHILOSOPHICAL MAGAZINE, 2004, 84 (25-26) : 2819 - 2828
  • [45] Direct imaging of Guinier-Preston zones by high-angle annular detector dark-field scanning transmission electron microscopy
    Konno, Toyohiko J.
    Kawasaki, Masahiro
    Hiraga, Kenji
    Microscopy, 2001, 50 (02): : 105 - 111
  • [46] SUBNANOMETER STRUCTURE VISIBLE IN HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY
    BRAKENHOFF, GJ
    JOURNAL OF MICROSCOPY, 1974, 100 (APR) : 283 - 297
  • [47] HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY OF SMALL METAL PARTICLES
    YACAMAN, MJ
    OCANAZ, T
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 42 (02): : 571 - 577
  • [48] Three-dimensional shapes and distribution of FePd nanoparticles observed by electron tomography using high-angle annular dark-field scanning transmission electron microscopy
    Sato, Kazuhisa
    Aoyagi, Kenta
    Konno, Toyohiko J.
    JOURNAL OF APPLIED PHYSICS, 2010, 107 (02)
  • [49] Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes
    Shiojiri, M.
    Saijo, H.
    JOURNAL OF MICROSCOPY, 2006, 223 : 172 - 178
  • [50] High-angle annular dark-field STEM of short range order in Ni-19.5% Mo Alloys
    Tanaka, N
    Pennycook, SJ
    Hu, JJ
    Hata, S
    Kuwano, N
    Oki, K
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 615 - 616