Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

被引:23
|
作者
Pomarico, Enrico [1 ]
Kim, Ye-Jin [2 ]
Javier Garcia de Abajo, F. [3 ]
Kwon, Oh-Hoon [4 ]
Carbone, Fabrizio [1 ]
van der Veen, Renske M. [5 ,6 ]
机构
[1] Ecole Polytech Fed Lausanne, Lausanne, Switzerland
[2] Ulsan Natl Inst Sci & Technol, Ulsan, South Korea
[3] Inst Ciencies Foton, Barcelona, Spain
[4] Ulsan Natl Inst Sci & Technol, Dept Chem, Ulsan, South Korea
[5] Univ Illinois, Dept Chem, Urbana, IL USA
[6] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL USA
基金
瑞士国家科学基金会;
关键词
electron energy-loss spectroscopy (EELS); laser-induced reaction; nanoscale; electronic structure; optical properties; NEAR-FIELD; IN-SITU; DIFFRACTION; DYNAMICS; RESOLUTION; SURFACE; MODE;
D O I
10.1557/mrs.2018.148
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.
引用
收藏
页码:497 / 503
页数:7
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