共 50 条
- [41] Low frequency noise in sub-100 nm MOSFETs PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2003, 19 (1-2): : 13 - 17
- [43] Resist requirements for sub-100 nm microlithography. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 215 : U191 - U191
- [46] Sub-100 nm structures by neutral atom lithography Microelectronic Engineering, 1999, 46 (01): : 105 - 108
- [47] Hardmask technology for sub-100 nm lithographic imaging ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XX, PTS 1 AND 2, 2003, 5039 : 152 - 165