A high-reliability and low-power computing-in-memory implementation within STT-MRAM

被引:13
|
作者
Zhang, Liuyang [1 ,2 ]
Deng, Erya [1 ,2 ]
Cai, Hao [3 ]
Wang, You [1 ,2 ]
Torres, Lionel [4 ]
Todri-Sanial, Aida [4 ]
Zhang, Youguang [1 ,2 ]
机构
[1] Beihang Univ, Fert Beijing Inst, Beijing 100191, Peoples R China
[2] Beihang Univ, Sch Elect & Informat Engn, Beijing 100191, Peoples R China
[3] Southeast Univ, Natl ASIC Syst Engn Ctr, Nanjing 210096, Jiangsu, Peoples R China
[4] Univ Montpellier, CNRS, LIRMM, F-34095 Montpellier, France
来源
MICROELECTRONICS JOURNAL | 2018年 / 81卷
基金
欧盟地平线“2020”; 中国国家自然科学基金;
关键词
Computing-in-memory (CIM); Nonvolatile memory (NVM); STT-MRAM; Memory wall;
D O I
10.1016/j.mejo.2018.09.005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the conventional Von-Neumann computer architecture, more energy and time are consumed by the data transport, rather than the computation itself because of the limited bandwidth between the processor and memory. Computing-in-memory (CIM) is therefore proposed to effectively address the issue by moving some specified kinds of computation into the memory. It has been proposed for several decades, however, not really used when considering the reliability and cost. With the emergence of non-volatile memories, the CIM has regained interest to tackle the issue. In this paper, we implement a CIM scheme: ComRef (Complementary Reference) within STT-MRAM (Spin Transfer Torque Magnetic Random-Access Memory), and then compare its reliability and performance with the DualRef (Dual Reference) CIM implementation. Simulation results reveal that the ComRef obviously improves the reliability by decreasing 67.1% of the operation error rate and by increasing up to 57.4% of the sensing margin. It accelerates the bitwise logic operation with cutting down 20.8% (similar to 41.1 ps) of the operation delay. Most importantly, it is highly energy efficient by reducing 23.4% of the average dynamic energy and 65.6% of the average static power. The ComRef provides a pathway to implement high-reliability and low-power CIM paradigm within STT-MRAM.
引用
收藏
页码:69 / 75
页数:7
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