The DA Phi NE beam position monitors

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作者
Ghigo, A
Sannibale, F
Serio, M
Vaccarezza, C
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BEAM INSTRUMENTATION - PROCEEDINGS OF THE SEVENTH WORKSHOP | 1997年 / 390期
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O59 [应用物理学];
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摘要
The beam diagnostics network of DA Phi NE, the Frascati Phi-factory, includes more than 110 beam position monitors divided between button monitors and striplines. The shape of the vacuum chamber changes along the accelerator implying several different geometries for these monitors. Moreover, in the two interaction regions of the collider where the electron and positron beams pass into the same chamber, a six-button configuration has been used. A bench calibration of each family of BPMs and striplines is being performed. A polynomial correction function has been derived by fitting the calibration results. An analytical-numerical analysis of the buttons' geometry has been done in order to compare the experimental with the theoretical results.
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页码:333 / 340
页数:8
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