Neutron-induced electron radiography

被引:3
|
作者
Pugliesi, R [1 ]
Andrade, MLG [1 ]
Pereira, MAS [1 ]
Pugliesi, F [1 ]
机构
[1] CNEN SP, IPEN, BR-05508000 Sao Paulo, Brazil
关键词
electron radiography; thin layers;
D O I
10.1016/j.nima.2005.01.015
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In the present work, a new radiographic methodology which makes use of conventional X-ray films and low-energy electrons as penetrating radiation, to inspect low-thickness samples, has been investigated. The radiographic characteristics for the "electron beam-film" set, regarding its sensitivity to discern thickness changes of materials, as well as the spatial resolution achieved in the image have been determined. Some radiographs are presented and demonstrate the method's potential to inspect thin samples. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:81 / 86
页数:6
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