Structural, magnetic, electronic, and spin transport properties of epitaxial Fe3Si/GaAs(001) -: art. no. 094401

被引:116
|
作者
Ionescu, A
Vaz, CAF
Trypiniotis, T
Gürtler, CA
García-Miquel, H
Bland, JAC
Vickers, ME
Dalgliesh, RA
Langridge, S
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[3] Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England
[4] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2BW, England
[5] Univ Loughborough, Dept Phys, Loughborough LE11 3TU, Leics, England
关键词
D O I
10.1103/PhysRevB.71.094401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report experimental results on the structural, magnetic, electronic, and spin transport properties of a 21 nm Fe3Si/GaAs(001) heterostructure epitaxially grown by coevaporation. High-resolution x-ray diffraction shows an almost stoichiometric film, which is lattice matched in-plane to the GaAs substrate and therefore slightly tetragonal distorted. Polarized neutron reflectometry measurements yield a magnetic moment of (1.107 +/- 0.014)mu(B) per atom at room temperature (RT), while superconducting quantum interference device magnetometry yields a magnetic moment of (0.9 +/- 0-0)mu(B) per atom at RT, both close to the bulk value. Magneto-optic Kerr effect measurements show that this system has in-plane cubic anisotropy with easy axes along the 100) directions and a cubic anisotropy constant K-1 =(3.1 +/- 0.6) X 10(4) erg/cm(3) at RT. A resistivity of (4.1 +/- 0.4) X 10(-7) Omega in in the Fe3Si film was measured, which is close to the bulk value. Optical spin orientation in the GaAs was used for spin transport measurements and spin detection is demonstrated at RT for this system. Point contact Andreev reflection spectroscopy was used to determine the spin polarization of the transport current, yielding P=(45 +/- 5)%.
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页数:9
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