An AFM study of environmental contaminants and lubricant morphology on the magnetic hard-disk surface.

被引：1

作者：

Chekanov, AS ^{[1
]}

Low, TS ^{[1
]}

Alli, S ^{[1
]}

Agarwal, S ^{[1
]}

Smith, S ^{[1
]}

机构：

[1] WESTERN DIGITAL,SAN JOSE,CA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期

关键词：

D O I：

10.1109/20.538817

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Atomic Force Microscopy was used to study some common hard-disk drive environmental contaminants. Possibility of application of AFM for the detection and characterization of the organic contaminants on the disk surface was demonstrated. Effects of contaminants on morphology of lubricant film are discussed.

引用

页码：3726 / 3728

页数：3

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