Dynamic X-ray direct conversion detector using a CdTe polycrystalline layer coupled to a CMOS readout chip

被引：5

作者：

Arques, Marc ^{[2
]}

Renet, Sebastien ^{[2
]}

Brambilla, Andrea ^{[2
]}

Feuillet, Guy ^{[2
]}

Gasse, Adrien ^{[2
]}

Billon-Pierron, Nicolas ^{[2
]}

Jolliot, Muriel ^{[2
]}

Mathieu, Lydie ^{[2
]}

Rohr, Pierre ^{[1
]}

机构：

[1] TRIXELL, F-38430 Moirans, France

[2] CEA LETI MINATEC, F-38054 Grenoble, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 633卷

关键词：

CdTe; Close space sublimation; CMOS; X-ray;

D O I：

10.1016/j.nima.2010.06.120

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A direct detection X-ray imager is presented. It uses polycrystalline cadmium telluride (CdTe) grown by close space sublimation technique for the X-ray photoconductor. A 15 mm x 15 mm CdTe layer is connected to a 200 x 200 pixel readout CMOS by indium bumping. X-ray performance at 16 frames/s rate is measured. In particular a readout noise of 0.5 X-ray, an MTF of 50% at 4 lp/mm and a DQE of 20% at 4 lp/mm are obtained. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：S55 / S58

页数：4

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