Epitaxial growth and electrical performance of graphene/3C-SiC films by laser CVD

被引:18
|
作者
Guo, Han [1 ]
Yang, Xiaoyu [1 ]
Xu, Qingfang [2 ]
Lu, Wenzhong [2 ]
Li, Jun [3 ]
Dai, Honglian [1 ]
Ohmori, Hitoshi [4 ]
Kosinova, Marina [5 ]
Yan, Jiasheng [6 ]
Li, Shusen [6 ]
Goto, Takashi [1 ]
Tu, Rong [1 ]
Zhang, Song [1 ]
机构
[1] Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, 122 Luoshi Rd, Wuhan 430070, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, 1037 Luoyu Rd, Wuhan, Peoples R China
[3] Inst Fluid Phys, Natl Key Lab Shock Wave & Detonat Phys, POB 919-102, Mianyang 621900, Sichuan, Peoples R China
[4] Inst Phys & Chem Res, 2-1 Hirosawa, Wako, Saitama 3510198, Japan
[5] Russian Acad Sci, Nikolaev Inst Inorgan Chem, Siberian Branch, 3 Acad Lavrerntiev Pr, Novosibirsk 630090, Russia
[6] Tech Semicond LTD, 162 Shengli St, Xiangyan 441021, Peoples R China
基金
对外科技合作项目(国际科技项目); 中国国家自然科学基金;
关键词
Graphene/SiC film; Epitaxial; Laser CVD; Electrical conductivity; Deposition rate; POLYCRYSTALLINE 3C-SIC FILMS; SILICON-CARBIDE CERAMICS; HETEROEPITAXIAL GROWTH; SAW RESONATORS; SIC FIBERS; THIN-FILMS; COMPOSITES; CARBON; SENSOR; HEXAMETHYLDISILANE;
D O I
10.1016/j.jallcom.2020.154198
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High electrical conductivity graphene/epitaxial-3C-SiC (G/epi-3C-SiC) composite films have the potential to the applications such as micro-electro-mechanical systems, distributed Bragg reflectors, solar cells, and photocatalysis in harsh environments. In this study, G/epi-3C-SiC composite films were prepared through laser chemical vapor deposition (LCVD) using hexametyldisilane (HMDS) as a safe single precursor. The electrical conductivity (sigma) of the composite films reached 2.23 x 10(4) S/m, which is 2.2 times of the highest sigma reported for G/epi-3C-SiC composite. The deposition rate (R-dep) of the composite film with the highest sigma is 8.2 times of that of the G/epi-3C-SiC with the highest sigma ever reported sigma of the pure epitaxial 3C-SiC film is only 81.2 S/m, which is the lowest value reported to date of 3C-SiC prepared through CVD using HMDS as a single precursor. Elimination of carbon is beneficial for increasing the breakdown field intensity and decreasing the leakage current of heterojunction when epitaxial 3C-SiC is used as semiconductor material. (C) 2020 Elsevier B.V. All rights reserved.
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页数:7
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