GRT at the SBST 2015 Tool Competition

被引：9
|
作者：
Ma, Lei [1 ,5 ]
Artho, Cyrille [2 ]
Zhang, Cheng [3 ]
Sato, Hiroyuki [1 ]
Hagiya, Masami [1 ]
Tanabe, Yoshinori [4 ]
Yamamoto, Mitsuharu [5 ]
机构：
[1] Univ Tokyo, Tokyo 1138654, Japan
[2] AIST, RISEC, Ibaraki, Japan
[3] Univ Waterloo, Waterloo, ON N2L 3G1, Canada
[4] Natl Inst Informat, Koganei, Tokyo, Japan
[5] Chiba Univ, Chiba, Japan
来源：
2015 IEEE/ACM 8TH INTERNATIONAL WORKSHOP ON SEARCH-BASED SOFTWARE TESTING (SBST) | 2015年
关键词：
Software testing; automatic test case generation; program analysis; random testing;
D O I：
10.1109/SBST.2015.19
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.
引用
收藏
页码：48 / 51
页数：4
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