Transverse space-charge induced microbunching instability in high-brightness electron bunches

被引:3
|
作者
Venturini, M. [1 ]
Qiang, J. [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevSTAB.18.054401
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
We identify a new mechanism for generation of the microbunching instability that involves the transverse rather than the longitudinal component of the self-fields. We introduce an analytical model that captures the essential features of the effect and use the model to interpret results from recent LCLS-II design studies.
引用
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页数:6
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