A Survey of the State-of-the-Art Fault Attacks

被引：0

作者：

Breier, Jakub ^{[1
]}

Jap, Dirmanto ^{[1
]}

机构：

[1] Nanyang Technol Univ, Div Math Sci, Phys Anal & Cryptog Engn, Temasek Labs NTU,Sch Phys & Math Sci, Singapore, Singapore

来源：

2014 14TH INTERNATIONAL SYMPOSIUM ON INTEGRATED CIRCUITS (ISIC) | 2014年

关键词：

physical cryptanalysis; fault attacks; AES; ECC; SIDE-CHANNEL ATTACKS; AES;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Since 1996, when Boneh, DeMillo and Lipton introduced the idea of fault attacks, many theoretical and practical publications were made on this topic. These attacks belong to the class of physical cryptanalysis attacks. In this paper we describe several methods of fault injection attacks. We provide an overview of both attacks and countermeasures on AES algorithm and on ECC.

引用

页码：152 / 155

页数：4

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