X-ray refraction characterization of non-metallic materials

被引：24
|
作者：
Harbich, KW [1 ]
Hentschel, MP [1 ]
Schors, J [1 ]
机构：
[1] Fed Inst Mat Res & Testing, D-2000 Hamburg, Germany
来源：
NDT & E INTERNATIONAL | 2001年 / 34卷 / 04期
关键词：
non-destructive characterization; X-ray refraction topography; pore size; crack density;
D O I：
10.1016/S0963-8695(00)00070-0
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Advanced materials require specific methods for their non-destructive characterization. X-ray refraction techniques determine the specific surfaces and interfaces of high performance ceramics, composites and other low density non-metallic materials down to nanometer dimensions. X-ray refraction occurs due to the interference of phase shifted X-rays in ultra small angle X-ray scattering at objects above 100 nm size. Applications to monolithic ceramics and ceramic composites are presented. The well localized mean pore size of ceramics at different stages of sintering and the crack growth of carbon fiber composites are measured non-destructively. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：297 / 302
页数：6
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