Lens inspection system using LoG and multi-level thresholds

被引：2

作者：

Yi, Jaeyoung ^{[1
]}

Kim, Kang-ho ^{[2
]}

Jung, Sung-Hwan ^{[1
]}

机构：

[1] Changwon Natl Univ, Dept Comp Engn, MIPS Lab, Kyongnam, South Korea

[2] M Tech, Kyongnam, South Korea

来源：

ALPIT 2007: PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON ADVANCED LANGUAGE PROCESSING AND WEB INFORMATION TECHNOLOGY | 2007年

关键词：

D O I：

10.1109/ALPIT.2007.27

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

An automatic defect detection system for the micro lens of a cellular phone was studied We presented a defect detection method using LoG filter and multiple level thresholds. We could find general defects such as scratch and even the stain defects that the detection might be difficult because of the low contrast between its background and a defect in the lens images. We did experiment using 50 spherical lens images with defects. As the experimental results, it showed the average recall and precision are about 92% 77% respectively in the case of sigma=2.5.

引用

页码：298 / +

页数：2

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