Individual electrical conductivity test for the assessment of soybean seed germination

Soybean seed quality is affected by many factors, which may occur during the production, processing, and storage phases. To ensure the quality of seeds, the adoption of fast and efficient methods to estimate seed viability in quality control programs is important. This study aimed to determine a partition point of the individual electrical conductivity test to predict soybean seed germination. Three lots each of five different soybean cultivars (Fundacep 57 RR, BMX Potencia RR, BMX Forca RR, BMX Turbo RR, and Nidera 7321 RG) were used. Seed quality was assessed through the mass of 1,000 seeds (MTS), moisture content (MC), germination test (G), bulk electrical conductivity (BEC), individual electrical conductivity (IEC), accelerated ageing (AA), and field seedling emergence (FSE). To determine a partition point in the IEC test for predicting germination, seeds were subjected to the germination test in the same position used for the IEC test. The accuracy of the partition point was tested by comparing predicted germination with the standard germination test. The partition point obtained for normal seeds was 130 mu S. cm(-1). seed(-1). The IEC test, however, had limitations in predicting soybean seed germination. The data for predicted germination were different from those obtained by the standard test, because the characteristics of each lot led to differences in the electrical conductivity values.