Limits to n-type doping in Ge: Formation of donor-vacancy complexes

被引:4
|
作者
Coutinho, J. [1 ]
Janke, C. [2 ]
Carvalho, A. [2 ]
Oberg, S. [3 ]
Torres, V. J. B. [1 ]
Jones, R. [2 ]
Briddon, P. R. [4 ]
机构
[1] Univ Aveiro, Dept Phys, Campus Santiago, P-3810193 Aveiro, Portugal
[2] Univ Exeter, Dept Phys, Exeter EX4 4QL, Devon, England
[3] Lulea Univ Technol, Dept Math, S-97187 Lulea, Sweden
[4] Newcastle Univ, Sch Nat Sci, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
来源
关键词
germanium; dopants; vacancies; compensation;
D O I
10.4028/www.scientific.net/DDF.273-276.93
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Vacancies and interstitials in semiconductors play a fundamental role in both high temperature diffusion and low temperature radiation and implantation damage. In Ge, a serious contender material for high-speed electronics applications, vacancies have historically been believed to dominate most diffusion related phenomena such as self-diffusivity or impurity migration. This is to be contrasted with silicon, where self-interstitials also play decisive roles, despite the similarities in the chemical nature of both materials. We report on density functional calculations of the formation and properties of vacancy-donor complexes in germanium. We predict that most vacancy-donor aggregates are deep acceptors, and together with their high solubilities, we conclude that they strongly contribute for inhibiting donor activation levels in germanium.
引用
收藏
页码:93 / +
页数:3
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