Influence of process parameters on the microstructure of scandium films deposited by electron-beam evaporation

被引:4
|
作者
Wu, Qingying [1 ]
Bing, Wenzeng [1 ]
Long, Xinggui [1 ]
Zhou, Xiaosong [1 ]
Liu, Jinhua [1 ]
Luo, Shunzhong [1 ]
机构
[1] China Acad Engn Phys, Inst Nucl Phys & Chem, Mianyang 621900, Peoples R China
基金
中国国家自然科学基金;
关键词
Scandium film; Electron-beam evaporation; Substrate temperature; Deposition rate; Microstructure; OPTICAL-PROPERTIES; SURFACE-ENERGY; HCP-METALS;
D O I
10.1016/j.vacuum.2011.12.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructures of scandium films deposited on molybdenum (Mo) substrates by electron-beam evaporation are investigated. Influences of substrate temperatures and deposition rates are considered. It is found that the microstructural changes of scandium films with the substrate temperatures are consistent with the reported structure-zone models. Sc films, deposited at 5 nm/s with the temperature range of 373-923 K. as well as deposited at 923 K with the deposition rate from 0.5 to 5 nm/s, show a (002) preferred orientation. Both the texture coefficients of (002) peaks and the grain sizes increase with the substrate temperature. For films deposited at various deposition rates, the films show smoother surfaces at the lower deposition rate. Moreover, the grain sizes first increase with the increasing deposition rate and then decrease with it. The largest grain size (similar to 246 nm) is obtained at the deposition rate of 5 nm/s. The texture coefficients of the (002) preferred orientation decrease when the deposition rate increases from 0.5 nm/s to 5 nm/s. And the preferred growth of the film disappears at deposition rate of 10 nm/s. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1347 / 1352
页数:6
相关论文
共 50 条
  • [31] CLASSIFICATION AND DIFFUSION BEHAVIOR OF NICKEL FILMS DEPOSITED ON THE COPPER SUBSTRATE BY ELECTRON-BEAM EVAPORATION, SPUTTERING AND ELECTRODEPOSITION
    BENHENDA, S
    GUGLIELMACCI, JM
    GILLET, M
    PECH, T
    APPLIED SURFACE SCIENCE, 1986, 25 (1-2) : 53 - 67
  • [32] Silicon nitride thin films deposited using electron-beam evaporation in an RF plasma MBE system
    Katzer, D. Scott
    Meyer, David J.
    Storm, David F.
    Nepal, Neeraj
    Wheeler, Virginia D.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2014, 32 (02):
  • [33] Characterization of Gd2O3 films deposited on Si(100) by electron-beam evaporation
    Landheer, D
    Gupta, JA
    Sproule, GI
    McCaffrey, JP
    Graham, MJ
    Yang, KC
    Lu, ZH
    Lennard, WN
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (02) : G29 - G35
  • [34] Effect of substrate temperature on structure and optical properties of ZnS thin films deposited by electron-beam evaporation
    Fu, Rui
    Hua, Qi-Lin
    Tu, Jie-Lei
    Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2013, 42 (07): : 1366 - 1370
  • [35] ALUMINUM-OXIDE FILMS OBTAINED BY ELECTRON-BEAM EVAPORATION
    VEIDENBAKH, LV
    GROMOVA, SN
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1983, 50 (09): : 566 - 568
  • [36] FABRICATION OF CDTE THIN-FILMS BY ELECTRON-BEAM EVAPORATION
    CAPORALETTI, O
    WESTCOTT, MR
    CANADIAN JOURNAL OF PHYSICS, 1985, 63 (06) : 798 - 800
  • [37] Properties of CdS films deposited by the electron beam evaporation technique
    Sivaramamoorthy, K.
    Bahadur, S. Asath
    Kottaisamy, M.
    Murali, K. R.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2010, 503 (01) : 170 - 176
  • [38] Texture and cross-sectional microstructure of MgO films grown on silicon dioxide by electron-beam evaporation
    Lee, Jeong Soo
    Gil Ryu, Byung
    Ja Kwon, Hyun
    Woo Jeong, Young
    Ha Kim, Hyun
    Thin Solid Films, 1999, 354 (01): : 82 - 86
  • [39] Texture and cross-sectional microstructure of MgO films grown on silicon dioxide by electron-beam evaporation
    Lee, JS
    Ryu, BG
    Kwon, HJ
    Jeong, YW
    Kim, HH
    THIN SOLID FILMS, 1999, 354 (1-2) : 82 - 86
  • [40] NONSTATIONARY EVAPORATION PROCESS DURING INTERACTION OF ELECTRON-BEAM WITH METAL
    ARTEMOV, VA
    VLASOV, MA
    ZHURNAL TEKHNICHESKOI FIZIKI, 1978, 48 (01): : 193 - 195