Electron and hole transport in ambipolar, thin film pentacene transistors

被引:4
|
作者
Saudari, Sangameshwar R. [1 ]
Kagan, Cherie R. [1 ,2 ,3 ]
机构
[1] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA
[2] Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA
[3] Univ Penn, Dept Chem, Philadelphia, PA 19104 USA
基金
美国国家科学基金会;
关键词
FIELD-EFFECT TRANSISTORS; MEYER-NELDEL RULE; ORGANIC SEMICONDUCTORS; CHARGE-TRANSPORT; EFFECT MOBILITY; GATE VOLTAGE; TEMPERATURE-DEPENDENCE; SEXITHIOPHENE; TRAPS;
D O I
10.1063/1.4906145
中图分类号
O59 [应用物理学];
学科分类号
摘要
Solution-processed, ambipolar, thin-film pentacene field-effect transistors were employed to study both electron and hole transport simultaneously in a single, organic solid-state device. Electron and hole mobilities were extracted from the respective unipolar saturation regimes and show thermally activated behavior and gate voltage dependence. We fit the gate voltage dependent saturation mobility to a power law to extract the characteristic Meyer-Neldel (MN) energy, a measure of the width of the exponential distribution of localized states extending into the energy gap of the organic semiconductor. The MN energy is similar to 78 and similar to 28 meV for electrons and holes, respectively, which reflects a greater density of localized tail states for electrons than holes. This is consistent with the lower measured electron than hole mobility. For holes, the well-behaved linear regime allows for four-point probe measurement of the contact resistance independent mobility and separate characterization of the width of the localized density of states, yielding a consistent MN energy of 28 meV. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:11
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