Sufficient conditions for direct methods with swift electrons

被引:8
|
作者
Marks, LD [1 ]
Sinkler, W
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60201 USA
[2] UOP LLC, Des Plaines, IL 60017 USA
关键词
diffraction; direct methods; precession; structure solution;
D O I
10.1017/S1431927603030332
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate cases where one can argue that sufficient conditions exist for Direct Methods to work with swift electrons. In addition to simple cases where kinematical scattering holds (e.g., surfaces in plan view), we identify three other configurations: (a) when is channeling holds and kinematical scattering is statistically correct; (b) when there is a mapping from kinematical to dynamical intensities that preserves the order of the intensities, for instance with powder or precession data, and (c) when the scattering is dominated by one type of atom. We also briefly discuss the possibility of using Direct Methods to restore the complex exit wave leaving a sample in the most general case.
引用
收藏
页码:399 / 410
页数:12
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