X-ray photoelectron spectroscopy of (La0.7Sr0.3)MnO3 thin films prepared by pulsed laser deposition

被引：2

作者：

Xiong, H. F. ^{[1
]}

Cheng, T. D. ^{[1
]}

Tang, X. G. ^{[1
]}

Chen, J. ^{[2
]}

Liu, Q. X. ^{[1
]}

机构：

[1] Guangdong Univ Technol, Sch Phys & Optoelect Engn, Guangzhou Higher Educ Mega Ctry, Guangzhou 510006, Guangdong, Peoples R China

[2] Sun Yat Sen Univ, Instrumental Anal & Res Ctr, Guangzhou 510275, Guangdong, Peoples R China

来源：

MATERIALS AND DESIGN, PTS 1-3 | 2011年 / 284-286卷

基金：

中国国家自然科学基金;

关键词：

LSMO thin films; X-ray photoelectron spectroscopy; Surface morphology; Chemical composition; Pulsed laser deposition; MAGNETORESISTANCE; PRESSURE; SURFACE;

D O I：

10.4028/www.scientific.net/AMR.284-286.2191

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

(La0.7Sr0.3)MnO3 (LSMO) thin films were grown on Si (100) substrate by using pulsed laser deposition (PLD) process. Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. From XRD, the results indicate that the films grown on Si (100) substrates have a single pseudocubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface. The films resistivity emeasured under room temperature is 6.4x10(-4) Omega.cm..

引用

页码：2191 / +

页数：3

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