X-ray photoelectron spectroscopy of (La0.7Sr0.3)MnO3 thin films prepared by pulsed laser deposition

被引：2
|
作者：
Xiong, H. F. [1 ]
Cheng, T. D. [1 ]
Tang, X. G. [1 ]
Chen, J. [2 ]
Liu, Q. X. [1 ]
机构：
[1] Guangdong Univ Technol, Sch Phys & Optoelect Engn, Guangzhou Higher Educ Mega Ctry, Guangzhou 510006, Guangdong, Peoples R China
[2] Sun Yat Sen Univ, Instrumental Anal & Res Ctr, Guangzhou 510275, Guangdong, Peoples R China
来源：
MATERIALS AND DESIGN, PTS 1-3 | 2011年 / 284-286卷
基金：
中国国家自然科学基金;
关键词：
LSMO thin films; X-ray photoelectron spectroscopy; Surface morphology; Chemical composition; Pulsed laser deposition; MAGNETORESISTANCE; PRESSURE; SURFACE;
D O I：
10.4028/www.scientific.net/AMR.284-286.2191
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
(La0.7Sr0.3)MnO3 (LSMO) thin films were grown on Si (100) substrate by using pulsed laser deposition (PLD) process. Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. From XRD, the results indicate that the films grown on Si (100) substrates have a single pseudocubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface. The films resistivity emeasured under room temperature is 6.4x10(-4) Omega.cm..
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收藏
页码：2191 / +
页数：3
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