Study of different dislocations in YBCO thin film

被引：0
|
作者：
Wang, SX
Liu, WL
Han, SH
Zhang, H [1 ]
机构：
[1] Peking Univ, Phys Mat Lab, State Key Lab Mesoscope Phys, Dept Phys, Beijing 100871, Peoples R China
[2] Shandong Univ, Sch Phys & Elect, Jinan 250100, Peoples R China
来源：
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2003年 / 17卷 / 18-20期
关键词：
D O I：
10.1142/S0217979203021344
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A series thin film sample of YBCO with different value of T-c was studied by high-resolution X-ray diffraction. Two different threading dislocations, the in-plane twist and the out-of-plane tilt, were studied carefully. It is found that the value of T-c is much more sensitive to the substrate normal tilt than to the in-plane twist. Dislocations with different Burgers vectors are suggested to exert different influence on the value of T-c of the YBCO thin film. The screw dislocation in the film is strongly influences the properties of the YBCO.
引用
收藏
页码：3530 / 3533
页数：4
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