Computer simulation of dynamic atomic force microscopy

被引：0
|
作者：
Abetkovskaia, S. O. [1 ]
Pozdnyakov, A. P. [2 ]
Siroezkin, S. V. [1 ]
Chizhik, S. A. [1 ]
机构：
[1] Natl Acad Sci Belarus, AV Luikov Heat & Mass Transfer Inst, 15 P Brovki St, Minsk 220072, BELARUS
[2] Belarusian State Univ, Minsk, BELARUS
来源：
RECENT ADVANCES IN MECHATRONICS | 2007年
关键词：
D O I：
10.1007/978-3-540-73956-2_108
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Mathematical modelling of dynamic force spectroscopy is carried out and a character of dependences of AFM probe vibration parameters on surface properties is revealed. Simulation of scanning process in tapping mode is performed.
引用
收藏
页码：551 / +
页数：2
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