Biometric-genetic analysis of genotype dissimilarity in diallel crosses of spring wheat

被引：1

作者：

Smiryaev, A. V. ^{[1
]}

Pyl'nev, V. V. ^{[1
]}

机构：

[1] Russian State Agrarian Univ, KA Timiryazev Agr Acad, Moscow 127550, Russia

来源：

RUSSIAN JOURNAL OF GENETICS | 2008年 / 44卷 / 02期

关键词：

Plant Height; Polymorphic Locus; Spring Wheat; Growth Trait; Winter Wheat Cultivar;

D O I：

10.1134/S1022795408020178

中图分类号：

Q3 [遗传学];

学科分类号：

071007 ; 090102 ;

摘要：

A new biometric-genetic model and parameters described in [2] have been used for analysis of pair dissimilarity between spring wheat cultivars and F-1 hybrids obtained by diallel crossing. The dissimilarity between shape of the reactions of different genotypes estimated by a growth trait (plant height) served as a metric. The mode of inheritance of dissimilarity has been determined, and the cultivars that are the most dissimilar in allelic composition have been detected.

引用

页码：234 / 239

页数：6

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