Properties of X-ray Cherenkov radiation produced by charged particles in Si/Mo multilayers

被引：1
|
作者：
Aginian, M. A. [1 ]
Gevorgian, L. A. [1 ]
Ispirian, K. A. [1 ]
Ispiryan, M. K. [1 ]
机构：
[1] Yerevan Phys Inst, Bros Alikhanian 2, Yerevan 375036, Armenia
来源：
INTERNATIONAL CONFERENCE ON CHARGED AND NEUTRAL PARTICLES CHANNELING PHENOMENA II - CHANNELING 2006 | 2007年 / 6634卷
关键词：
Cherenkov radiation; transition radiation; X-ray mirrors;
D O I：
10.1117/12.741931
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The angular-spectral distributions as well as the dependence of the total number of photons of X-ray Cherenkov radiation upon the number, thickness of the layers and on particle energy have been calculated using the theoretical formulae taking into account the reflection from the interfaces between the two media of the Si/Mo multilayers. The possibilities of the experimental investigation have been discussed.
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页数：7
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