Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping

被引：3
|
作者：
Haye, Emile [1 ,2 ]
Pierron, Victor [1 ]
Barrat, Silvere [1 ]
Capon, Fabien [1 ]
Munnik, Frans [3 ]
Bruyere, Stephanie [1 ]
机构：
[1] Univ Lorraine, IJL, CNRS, UMR 7198, Parc Saurupt, F-54011 Nancy, France
[2] UNamur, LISE, Dept Phys, 61 Rue Bruxelles, B-5000 Namur, Belgium
[3] HZDR, Ion Beam Ctr, Bautzner Landstr 400, D-01328 Dresden, Germany
来源：
APPLIED SURFACE SCIENCE | 2018年 / 427卷
关键词：
Oxynitride perovskite; Thermal stability; EELS mapping; FTIR; OXYNITRIDE PEROVSKITES; CA; OXIDATION; DRIVEN; SR; BA;
D O I：
10.1016/j.apsusc.2017.09.090
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O-2/N-2 gas mixture at 800 degrees C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm(-1), due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：1041 / 1045
页数：5
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