Spatial, energy, and time-dependent study of surface charging using spectroscopy and microscopy techniques

被引：1
|
作者：
Di Santo, Giovanni [1 ]
Coluzza, Carlo [1 ]
Flammini, Roberto [2 ]
Zanoni, Robertino [3 ]
Decker, Franco [3 ]
机构：
[1] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy
[2] CNR, IMIP, Rome, Italy
[3] Univ Roma La Sapienza, Dipartimento Chim, I-00185 Rome, Italy
来源：
JOURNAL OF APPLIED PHYSICS | 2007年 / 102卷 / 11期
关键词：
D O I：
10.1063/1.2817915
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Spatial, energy, and time-dependent effects induced by surface charging of conductive and nonconductive samples have been studied by spectroscopic and microscopic techniques. Surface charging of indium-tin oxide and cesium iodide has been studied by atomic force microscopy with a conducting tip and photoemission electron microscopy. Intensity fluctuations of the photoemission spectra recorded on amorphous and crystalline silicon nitride are also presented. The consequence of such effects on the determination of local physical and chemical properties of insulating materials is discussed. (c) 2007 American Institute of Physics.
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