Electronic structure of twin boundaries in 3C-SiC, Si and diamond

被引:0
|
作者
Iwata, H [1 ]
Lindefelt, U
Öberg, S
Briddon, PR
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
[2] Royal Inst Technol, Dept Microelect & Informat Technol, SE-16440 Kista, Sweden
[3] ABB Grp, Serv Ctr, Corp Res, SE-72178 Vasteras, Sweden
[4] Lulea Univ Technol, Dept Math, SE-97187 Lulea, Sweden
[5] Newcastle Univ, Dept Phys, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
关键词
3C-SiC; first-principles calculations; stacking faults; twin boundaries;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on a first-principles band structure calculation of twin boundaries in 3C-SiC, Si, and diamond, based on the density functional theory in the local density approximation. It is found that the electron wave functions belonging to the conduction and valence band edge states in 3C-SiC tend to be localized almost exclusively on different sides of the boundaries, while there is no such feature in Si and diamond. We have interpreted these localization and segregation phenomena as a consequence of the electrostatic field caused by the spontaneous polarization due to the hexagonal symmetry around twin boundaries. A mechanism for the creation of twin boundaries, i.e., propagation of partial dislocations in neighboring basal planes, has been investigated using total energy calculations, and it has been realized that the double-intrinsic-stacking-fault structure in 3C-SiC, coinciding with the extrinsic stacking faults, is much energetically favored.
引用
收藏
页码:527 / 530
页数:4
相关论文
共 50 条
  • [21] Microtwins and twin inclusions in the 3C-SiC epilayers grown on Si(001) by APCVD
    郑新和
    戴自忠
    渠波
    杨辉
    王玉田
    梁骏吾
    Science China Mathematics, 2001, (06) : 777 - 782
  • [22] Microtwins and twin inclusions in the 3C-SiC epilayers grown on Si(001) by APCVD
    郑新和
    戴自忠
    渠波
    杨辉
    王玉田
    梁骏吾
    ScienceinChina,SerA., 2001, Ser.A.2001 (06) : 777 - 782
  • [23] Laser irradiation influence on Si/3C-SiC/Si heterostructures for subsequent 3C-SiC membrane elaboration
    J. F. Michaud
    R. Khazaka
    M. Portail
    G. Andrä
    J. Bergmann
    D. Alquier
    MRS Advances, 2016, 1 (54) : 3649 - 3654
  • [24] Atomistic investigation of effect of twin boundary on machinability in diamond cutting of nanocrystalline 3C-SiC
    Zhao, Liang
    Guan, Weimian
    Xu, Jiwen
    Sun, Zhiyuan
    Zhang, Maoda
    Zhang, Junjie
    AIMS MATERIALS SCIENCE, 2024, 11 (06) : 1149 - 1164
  • [25] Characterization of Schottky Barrier Diodes on Heteroepitaxial Diamond on 3C-SiC/Si Substrates
    Murooka, Takuya
    Hatano, Mutsuko
    Yaita, Junya
    Makino, Toshiharu
    Ogura, Masahiko
    Kato, Hiromitsu
    Yamasaki, Satoshi
    Natal, Meralys
    Saddow, Stephen E.
    Iwasaki, Takayuki
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (01) : 212 - 216
  • [26] Electronic structure and optical vibrational modes of 3C-SiC nanowires
    Trejo, Alejandro
    Ojeda, Miguel
    Luis Cuevas, Jose
    Miranda, Alvaro
    Perez, Luis A.
    Cruz-Irisson, Miguel
    INTERNATIONAL JOURNAL OF NANOTECHNOLOGY, 2015, 12 (3-4) : 275 - 284
  • [27] ELECTRONIC-STRUCTURE AND OPTICAL-PROPERTIES OF 3C-SIC
    LUBINSKY, AR
    ELLIS, DE
    PAINTER, GS
    PHYSICAL REVIEW B, 1975, 11 (04): : 1537 - 1546
  • [28] Suppression of the twin formation in CVD growth of (111) 3C-SiC on (110) Si substrate
    Nishiguchi, T
    Nakamura, M
    Nishio, K
    Isshiki, T
    Ohshima, S
    Nishino, S
    SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 193 - 196
  • [29] Effect of 3C-SiC Layer Thickness on Lateral Photovoltaic Effect in 3C-SiC/Si Heterojunction
    Nguyen, Tuan-Hung
    Foisal, Abu Riduan Md
    Pham, Tuan Anh
    Vu, Trung-Hieu
    Nguyen, Hong-Quan
    Streed, Erik W.
    Fastier-Wooller, Jarred
    Duran, Pablo Guzman
    Tanner, Philip
    Dau, Van Thanh
    Nguyen, Nam-Trung
    Dao, Dzung Viet
    IEEE SENSORS JOURNAL, 2023, 23 (03) : 2063 - 2069
  • [30] Structure and ultraviolet photoluminescence of 3C-SiC films grown on Si(111)
    L. K. Orlov
    Yu. N. Drozdov
    N. A. Alyabina
    N. L. Ivina
    V. I. Vdovin
    I. N. Dmitruk
    Physics of the Solid State, 2009, 51