Electronic structure of twin boundaries in 3C-SiC, Si and diamond

被引:0
|
作者
Iwata, H [1 ]
Lindefelt, U
Öberg, S
Briddon, PR
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
[2] Royal Inst Technol, Dept Microelect & Informat Technol, SE-16440 Kista, Sweden
[3] ABB Grp, Serv Ctr, Corp Res, SE-72178 Vasteras, Sweden
[4] Lulea Univ Technol, Dept Math, SE-97187 Lulea, Sweden
[5] Newcastle Univ, Dept Phys, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
关键词
3C-SiC; first-principles calculations; stacking faults; twin boundaries;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on a first-principles band structure calculation of twin boundaries in 3C-SiC, Si, and diamond, based on the density functional theory in the local density approximation. It is found that the electron wave functions belonging to the conduction and valence band edge states in 3C-SiC tend to be localized almost exclusively on different sides of the boundaries, while there is no such feature in Si and diamond. We have interpreted these localization and segregation phenomena as a consequence of the electrostatic field caused by the spontaneous polarization due to the hexagonal symmetry around twin boundaries. A mechanism for the creation of twin boundaries, i.e., propagation of partial dislocations in neighboring basal planes, has been investigated using total energy calculations, and it has been realized that the double-intrinsic-stacking-fault structure in 3C-SiC, coinciding with the extrinsic stacking faults, is much energetically favored.
引用
收藏
页码:527 / 530
页数:4
相关论文
共 50 条
  • [1] Energies and electronic properties of isolated and interacting twin boundaries in 3C-SiC, Si, and diamond -: art. no. 113202
    Iwata, HP
    Lindefelt, U
    Oberg, S
    Briddon, PR
    PHYSICAL REVIEW B, 2003, 68 (11)
  • [2] Impact of Inversion Domain Boundaries on the Electronic Properties of 3C-SiC
    Scalise, Emilio
    Zimbone, Massimo
    Marzegalli, Anna
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2022, 259 (09):
  • [3] Atomic and electronic structure analysis of Σ=3 incoherent twin boundaries in β-SiC
    Tanaka, K
    Kohyama, M
    JOURNAL OF ELECTRON MICROSCOPY, 2002, 51 : S265 - S270
  • [4] Reductions of twin and protrusion in 3C-SiC heteroepitaxial growth on Si(100)
    Yun, J
    Takahashi, T
    Mitani, T
    Ishida, Y
    Okumura, H
    JOURNAL OF CRYSTAL GROWTH, 2006, 291 (01) : 148 - 153
  • [5] Electronic structure of the anti-structure pair in 3C-SiC
    Laboratory of Physics, Helsinki University of Technology, PO Box 1100, Helsinki, FIN-02015 HUT, Finland
    Mater Sci Eng B Solid State Adv Technol, 1600, (593-596):
  • [6] The structure of 3C-SiC carbonized layer on Si substrate
    Kamata, I
    Tsuchida, H
    Izumi, K
    MICROELECTRONIC ENGINEERING, 1998, 43-4 : 647 - 654
  • [7] The structure of 3C-SiC carbonized layer on Si substrate
    Kamata, I.
    Tsuchida, H.
    Izumi, K.
    Microelectronic Engineering, 1998, 43-44 : 647 - 654
  • [8] Electronic structure of the anti-structure pair in 3C-SiC
    Torpo, L
    Nieminen, RM
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 61-2 : 593 - 596
  • [9] Growth and characterization of 3C-SiC/SiNx/Si structure
    Kim, Kwang Chul
    Park, Chan Il
    Nahm, Kee Suk
    Suh, Eun-Kyung
    Materials Science Forum, 2000, 338
  • [10] ENERGIES AND STRUCTURES OF (111) COINCIDENCE TWIST BOUNDARIES IN 3C-SIC, DIAMOND, AND SILICON
    KOHYAMA, M
    YAMAMOTO, R
    DOYAMA, M
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1986, 136 (01): : 31 - 36