Metallic glass;
Current sensor;
Micro-cantilever;
Resonant sensor;
MICROSTRUCTURE FABRICATION;
MEMS;
D O I:
10.1016/j.mee.2015.02.043
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We report on the development of MEMS current sensors composed of Fe67.5B22.5Nd6.3Nb3.7 (FBNN) magnetic metallic glass thin films. These current sensors are based on free-standing cantilever structures that benefit from the superior mechanical properties of the metallic glass, such as high fracture toughness and high yield strength. The resonant frequency of the proposed FBNN cantilever was 3.85 kHz in the fundamental flexure mode when the length, width and thickness of the cantilever were 750 mu m, 150 mu m and 3 mu m, respectively. A feed wire with a diameter of 500 mu m was placed close to the FBNN cantilever, and a downshift in the resonance peak was observed when the current intensity through the feed wire increased. The sensitivity of this frequency shift to the current intensity was 5.0 root Hz/A when the distance between the cantilever and the wire was 500 mu m. (C) 2015 Elsevier B.V. All rights reserved.
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Xu Min
Sun Yu
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机构:Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Sun Yu
Quan Mingxiu
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机构:Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Quan Mingxiu
Wang Yandong
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机构:Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Wang Yandong
Zuo Liang
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机构:Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China