Electronic, Mechanical and Dielectric Properties of Silicane under Tensile Strain

被引:2
|
作者
Jamdagni, Pooja [1 ]
Kumar, Ashok [2 ]
Sharma, Munish [1 ]
Thakur, Anil [3 ]
Ahluwalia, P. K. [1 ]
机构
[1] Himachal Pradesh Univ, Dept Phys, Shimla 171005, Himachal Prades, India
[2] Panjab Univ, Dept Phys, Chandigarh 160014, India
[3] Govt Collage Solan, Dept Phys, Solan 173212, Himachal Prades, India
关键词
1ST PRINCIPLE; SILICENE; SEMICONDUCTORS;
D O I
10.1063/1.4915398
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The electronic, mechanical and dielectric properties of fully hydrogenated silicene i.e. silicane in stable configuration are studied by means of density functional theory based calculations. The band gap of silicane monolayer can be flexibly reduced to zero when subjected to bi-axial tensile strain, leading to semi-conducting to metallic transition, whereas the static dielectric constant for in-plane polarization increases monotonically with increasing strain. Also the EEL function show the red shift in resonance peak with tensile strain. Our results offer useful insight for the application of silicane monolayer in nano-optical and electronics devices.
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页数:3
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