Time resolved X-ray studies in semiconductor nanostructures

被引：0
|
作者：
Jurgilaitis, A. [1 ]
Harb, M. [1 ]
Enquist, H. [1 ]
Nuske, R. [1 ]
Persson, A. [1 ]
Larsson, J. [1 ]
机构：
[1] Lund Univ, Dept Phys, Atom Phys Div, S-22100 Lund, Sweden
来源：
2012 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2012年
关键词：
PHONONS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.
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页数：2
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