Investigating the optical properties of dislocations by scanning transmission electron microscopy

被引：24
|
作者：
Pennycook, S. J. [1 ]
机构：
[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA
来源：
SCANNING | 2008年 / 30卷 / 04期
关键词：
cathodoluminescence; dislocations; core structures; scanning transmission electron microscopy; electron energy loss spectroscopy; optical properties;
D O I：
10.1002/sca.20114
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The scanning transmission electron microscope (STEM) allows collection of a number Of simultaneous signals, such as cathodoluminescence (CL), transmitted electron intensity and spectroscopic information from individual localized defects. This review traces the development of CL and atomic resolution imaging from their early inception through to the possibilities that exist today for achieving a true atomic-scale understanding of the optical properties of individual dislocations cores. This review is dedicated to Professor David Holt, a pioneer in this field.
引用
收藏
页码：287 / 298
页数：12
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