X-ray topography on La3Ta0.5Ga5.5O14 single crystal grown by Czochralski method

被引：0

作者：

Yoneda, Y. ^{[1
]}

Mizuki, J. ^{[1
]}

Takeda, H. ^{[2
]}

Shiosaki, T. ^{[2
]}

机构：

[1] Japan Atom Energy Agcy, Synchrotron Radiat Res Unit, Kouto 1-1-1, Sayo Gun, Hyogo 6795148, Japan

[2] Nara Inst Sci & Technol, Grad Sch Mat Sci, Nara 6300192, Japan

来源：

2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2 | 2007年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We performed synchrotron X-ray topography on a La3Ta0.5Ga5.5O14 (LTG) crystal grown by the Czochralski (Cz) method. Since the synchrotron X-ray source can provide high-energy X-rays, one can detect bulk-sensitive information by the X-ray topography. LTG is one of the most attractive piezoelectric crystals like La3Ga5SiO14 (LGS), because of excellent acoustic properties (temperature compensation of acoustic losses). Since LTG single crystals can be grown from stoichiometric melt, single crystals with good crystal quality can be obtained comparing to LGS which can not be grown from stoichiometric system but from congruent melt. The 60-keV X-ray topography revealed that the LTG crystal quality was not the same crystalline quality. The crystal quality of a center parts was worse than that of surroundings.

引用

页码：584 / +

页数：2

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