Effects of bath temperature in electrodeposited FeSe2 thin films

被引:33
|
作者
Mahalingam, T. [1 ]
Thanikaikarasan, S.
Chandramohan, R.
Raja, M.
Sanjeeviraja, C.
Kim, Jong-Ho
Kim, Yong Deak
机构
[1] Ajou Univ, Coll Informat Technol, Dept Elect & Comp Engn, Suwon 443749, South Korea
[2] Alagappu Univ, Dept Phys, Karaikkudi 630003, Tamil Nadu, India
[3] Sree Sevugan Annamalai Coll, Dept Chem, Devakottai 630303, India
关键词
thin films; electron microscopy; optical properties; energy dispersive analysis of X-rays;
D O I
10.1016/j.matchemphys.2007.06.014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of iron diselenide (FeSe2) were electrodeposited on tin oxide coated conducting glass substrates at various bath temperatures. The deposited films were characterized by X-ray diffraction (XRD), optical, energy dispersive analysis of X-rays (EDAX) and scanning electron microscopy (SEM). The structure was found to be orthorhombic with preferential orientation along [1 2 1] plane. X-ray line profile analysis technique by the method of variance has been used to evaluate the microstructural parameters. Various microstructural parameters such as, crystallite size, rms strain, dislocation density and stacking fault probability affecting the fraction of planes with film thickness and bath temperatures were studied. The experimental observations are discussed in detail. (c) 2007 Published by Elsevier B.V.
引用
收藏
页码:369 / 374
页数:6
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