共 50 条
- [41] Grain orientation mapping of passivated aluminum interconnect lines by x-ray micro-diffraction CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 424 - 426
- [43] Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling JOURNAL DE PHYSIQUE IV, 2002, 12 (PR6): : 409 - 416
- [44] X-ray diffraction study of InGaN/GaN superlattice interfaces JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1839 - 1843
- [45] X-RAY DIFFRACTION STUDY OF HYDRATION PROCESSES IN THE PORTLAND CEMENT JOURNAL OF APPLIED ENGINEERING SCIENCES, 2011, 1 (01): : 79 - 86
- [49] X-ray micro diffraction -: Part 2:: X-ray Rotation-Tilt Method MATERIALPRUFUNG, 2004, 46 (03): : 118 - 125