Test point selection based on binary grey wolf optimization algorithm for analog circuit

With the increase of integration densities and complexity of electronic equipment, higher requirement to testability design of electronic equipment was put forward. Test point selection is an important part of testability design. The test point selection method also needs to be researched in depth. A test point selection method based on binary grey wolf optimization is proposed to optimize analog test point selection in this paper. The efficiency of the proposed method is proven by the same experiments used to verify other methods for optimal test points. Results show that the proposed algorithm in this paper cannot only reduce the computation complexity but also shorten the time consumption. It is particularly useful for large-scale analog circuits.