ART-XC/SRG: status of the X-ray focal plane detector development

被引:9
|
作者
Levin, Vasiliy [1 ]
Pavlinsky, Mikhail [1 ]
Akimov, Valeriy [1 ]
Kuznetsova, Maria [1 ]
Rotin, Alexey [1 ]
Krivchenko, Alexander [1 ]
Lapshov, Igor [1 ]
Oleinikov, Vladimir [1 ]
机构
[1] Space Res Inst IKI, Moscow 117997, Russia
关键词
CdTe; CdZnTe; semiconductor detector; DSSD; X-ray telescope; CDTE;
D O I
10.1117/12.2056311
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The Russian Space Research Institute (IKI) has developed CdTe detectors for the focal plane of the ART-XC/SRG instrument. The CdTe crystal has dimensions about 30 x 30 x 1 mm. Top and bottom sides of the detector each contain 48 strips and a guard ring. The ASIC VA64TA1 is connected to the CdTe crystal by AC-coupling for both DSSD sides. This approach allows one to have the same ground level for both electronic parts and to operate detectors with different leakage currents without reconfiguration of the VA64TA1 chips. One CdTe crystal and two ASICs are integrated with thermal sensors and Peltier cooler in a big hybrid integrated circuit. This detector is hermetically sealed by a cover with beryllium window. For ground testing the detector volume is filled with dry nitrogen. Peltier cooler is used during ground tests only. Together with the hermetic case package it allows us to operate the detector at low temperature during all ART-XC telescope development tests. When in space, the detector cooling will be provided by a radiator and heat pipes. Polarization rate temperature and voltage dependences as well as splitting charges between electrodes are being studied. IKI manufactured dozen X-ray cameras with detectors and supporting electronics for EM, QM and flight model of the ART-XC telescope. Spectroscopic and imaging performances of the detectors were tested on the IKI's X-Ray Calibration Facility. Current status of the focal plane detector development and testing will be presented.
引用
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页数:9
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