A comprehensive model of catastrophic optical-damage in broad-area laser-diodes

被引：3
|
作者：
Chin, A. K. [1 ]
Bertaska, R. K. [2 ]
Jaspan, M. A.
Flusberg, A. M. [3 ]
Swartz, S. D. [3 ]
Knapczyk, M. T. [3 ]
Petr, R. [3 ]
Smilanski, I. [3 ]
Jacob, J. H. [3 ]
机构：
[1] Aland Chin LLC, 45 Manomet Rd, Sharon, MA 02067 USA
[2] New England Analyt LLC, Nashua, NH 03060 USA
[3] Sci Res Lab Inc, Somerville, MA 02143 USA
来源：
HIGH-POWER DIODE LASER TECHNOLOGY AND APPLICATIONS VII | 2009年 / 7198卷
关键词：
Broad-area diode-lasers; catastrophic optical-damage; reliability; failure-mode analysis; GAAS;
D O I：
10.1117/12.804834
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The present model of formation and propagation of catastrophic optical-damage (COD), a random failure-mode in laser diodes, was formulated in 1974 and has remained substantially unchanged. We extend the model of COD phenomena, based on analytical studies involving EBIC (electron-beam induced current), STEM (scanning transmission-electron microscopy) and sophisticated optical-measurements. We have determined that a ring-cavity mode, whose presence has not been previously reported, significantly contributes to COD initiation and propagation in broad-area laser-diodes.
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收藏
页数：16
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