Manipulation of freestanding Au nanogears using an atomic force microscope

被引:23
|
作者
Yun, Yong Ju [1 ]
Ah, Chil Seong [1 ]
Kim, Sanghun [1 ]
Yun, Wan Soo [1 ]
Park, Byong Chon [1 ]
Ha, Dong Han [1 ]
机构
[1] Korea Res Inst Stand & Sci, Div Adv Technol, Taejon 305600, South Korea
关键词
D O I
10.1088/0957-4484/18/50/505304
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have fabricated freestanding nanogears by selectively etching single crystalline Au nanoplates and assembled them tooth to tooth using an atomic force microscope (AFM). The nanogears, with one center hole surrounded by six teeth, are smaller than 500 nm in overall size and 60-70 nm in thickness. We demonstrate that blunt AFM tips on stiff cantilevers are effective for the nondestructive manipulation of ductile and flat nano-objects having large contact areas with the substrate, and we discuss the results on the basis of nanomechanical aspects. We expect that the precise AFM manipulation combined with the etch-based fabrication techniques for the freestanding nanocomponents will be useful in the development and post-repair of sophisticated nanoelectromechanical systems.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Nanolithography and manipulation of graphene using an atomic force microscope
    Giesbers, A. J. M.
    Zeitler, U.
    Neubeck, S.
    Freitag, F.
    Novoselov, K. S.
    Maan, J. C.
    SOLID STATE COMMUNICATIONS, 2008, 147 (9-10) : 366 - 369
  • [2] NANOMACHINING AND MANIPULATION WITH THE ATOMIC FORCE MICROSCOPE
    LIEBER, CM
    KIM, Y
    ADVANCED MATERIALS, 1993, 5 (05) : 392 - 394
  • [3] Robust controlled manipulation of nanoparticles using atomic force microscope
    Korayem, M. H.
    Omidi, E.
    MICRO & NANO LETTERS, 2012, 7 (09): : 927 - 931
  • [4] Manipulation and soldering of carbon nanotubes using atomic force microscope
    Kashiwase, Yuta
    Ikeda, Takayuki
    Oya, Takahide
    Ogino, Toshio
    APPLIED SURFACE SCIENCE, 2008, 254 (23) : 7897 - 7900
  • [5] Manipulation of insulated molecular wire with atomic force microscope
    Akai, T
    Abe, T
    Shimomura, T
    Ito, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (12A): : L1327 - L1329
  • [6] CONTROLLED MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE
    JUNNO, T
    DEPPERT, K
    MONTELIUS, L
    SAMUELSON, L
    APPLIED PHYSICS LETTERS, 1995, 66 (26) : 3627 - 3629
  • [7] Radical chemistry and charge manipulation with an atomic force microscope
    Gross, Leo
    Schuler, Bruno
    Pavlicek, Niko
    Fatayer, Shadi
    Majzik, Zsolt
    Moll, Nikolaj
    Meyer, Gerhard
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 253
  • [8] Imaging and manipulation of gold nanorods with an atomic force microscope
    Hsieh, SC
    Meltzer, S
    Wang, CRC
    Requicha, AAG
    Thompson, ME
    Koel, BE
    JOURNAL OF PHYSICAL CHEMISTRY B, 2002, 106 (02): : 231 - 234
  • [9] Automated Manipulation of Flexible Nanowires with an Atomic Force Microscope
    Wu, Sen
    Bai, Huitian
    Jin, Fan
    2017 IEEE INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO), 2017, : 229 - 235
  • [10] Manipulation of cadmium selenide nanorods with an atomic force microscope
    Tranvouez, E.
    Orieux, A.
    Boer-Duchemin, E.
    Devillers, C. H.
    Huc, V.
    Comtet, G.
    Dujardin, G.
    NANOTECHNOLOGY, 2009, 20 (16)