An exploration of combinatorial testing-based approaches to fault localization for explainable AI

被引:4
|
作者
Kampel, Ludwig [1 ]
Simos, Dimitris E. [1 ]
Kuhn, D. Richard [2 ]
Kacker, Raghu N. [2 ]
机构
[1] SBA Res, A-1040 Vienna, Austria
[2] NIST, Gaithersburg, MD 20899 USA
关键词
AI; Explainable AI; Combinatorial testing; Fault localization; ARRAYS;
D O I
10.1007/s10472-021-09772-0
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We briefly review properties of explainable AI proposed by various researchers. We take a structural approach to the problem of explainable AI, examine the feasibility of these aspects and extend them where appropriate. Afterwards, we review combinatorial methods for explainable AI which are based on combinatorial testing-based approaches to fault localization. Last, we view the combinatorial methods for explainable AI through the lens provided by the properties of explainable AI that are elaborated in this work. We pose resulting research questions that need to be answered and point towards possible solutions, which involve a hypothesis about a potential parallel between software testing, human cognition and brain capacity.
引用
收藏
页码:951 / 964
页数:14
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