<bold>Reflectance Modeling for Layered Dielectrics with Rough Surface Boundaries</bold>

被引:0
|
作者
Ragheb, Hossein [1 ]
Hancock, Edwin R. [2 ]
机构
[1] Bu Ali Sina Univ, Dept Comp Engn, Hamadan, Iran
[2] Univ York, Dept Comp Sci, York YO10 5DD, N Yorkshire, England
关键词
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
A new model for the scattering of light from layered dielectrics with rough surface boundaries is introduced. The model contains a surface scattering component together with a subsurface scattering component. The former component corresponds to the roughness on the upper surface boundary and is modeled using the modified Beckmann model. The latter component accounts for both refraction due to Fresnel transmission through the layer and rough scattering at the lower layer boundary By allowing independent roughness parameters for each surface boundary we can achieve excellent fits of the model to the measured BRDF data. Using a well known method of testing reflectance models, we experiment with BRDF data from skin surface samples (human volunteers) and show that the new model outperforms alternative variants of the Beckmann model and the Lafortune et al. reflectance model. As an application in computer graphics, we also show that realistic images of 3D surfaces can be generated using the new model, by setting the values of its physical parameters.
引用
收藏
页码:302 / 309
页数:8
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