Plasma curvature effects on microwave reflectometry fluctuation measurements

被引:58
|
作者
Lin, Y
Nazikian, R
Irby, JH
Marmar, ES
机构
[1] MIT, Plasma Sci & Fus Ctr, Cambridge, MA 02139 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
关键词
Computer simulation - Geometrical optics - Mathematical models - Numerical analysis - Plasma density - Reflectometers - Tokamak devices;
D O I
10.1088/0741-3335/43/1/101
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Plasma poloidal curvature can significantly extend microwave reflectometry responses to high k(perpendicular to) poloidal fluctuations. Reflectometry responses can be several orders of magnitude larger at high k(perpendicular to) than that predicted by analysis based on two dimensional (2-D) slab geometry. As a result, the responses may approach the 1-D geometrical optics limit. This superresolution leads to a major modification of the spectral resolution of reflectometry. The phenomenon is analysed using a phase screen model for the general cases and the results are supported by detailed numerical 2-D realistic geometry full wave simulations for the specific case of the Alcator C-Mod tokamak.
引用
收藏
页码:L1 / L8
页数:8
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