Electronic speckle pattern interferometry for JWST

被引：0
|
作者：
Saif, Babak [1 ]
Bluth, Marcel [2 ]
Eegholm, Bente [2 ]
Zukowski, Barbara [2 ]
Keski-Kuha, Ritva [3 ]
Blake, Peter [3 ]
机构：
[1] Space Telescope Sci Inst, 3700 San Martin Dr, Baltimore, MD 21218 USA
[2] Swales Aerospace, Beltsville, MD 20705 USA
[3] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
来源：
2007 IEEE AEROSPACE CONFERENCE, VOLS 1-9 | 2007年
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
Development of many new technologies is required to successfully produce the large, lightweight, deployable, cryogenic telescope with segmented primary mirror for the James Webb Space Telescope (JWST) mission. One of the technologies is interferometry to verify structural deformations in large, deployable, lightweight, cryogenic, precision structures to nanometer level accuracy. An instantaneous acquisition phase shifting speckle interferometer was designed and built to support the development of JWST Optical Telescope Element (OTE) primary mirror backplane. This paper discusses characterization of the Electronic Speckle Pattern Interferometer (SPS-DSPI) developed for JWST to verify its capability to measure structural deformations in large composite structures at cryogenic temperature.(1).
引用
收藏
页码：1649 / 1658
页数：10
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