The Effect of Softbaking Temperature on SU-8 Photoresist Performance

被引:0
|
作者
Johari, Shazlina [1 ]
Tamilchelvan, Nithiyah [1 ]
Nor, Mohammad Nuzaihan Md [2 ]
Ramli, Muhammad Mahyiddin [1 ]
Taib, Bibi Nadia [1 ]
Mazalan, Mazlee [1 ]
Wahab, Yufridin [1 ]
机构
[1] Univ Malaysia Perlis, Sch Microelect Engn, Adv Multidisciplinary MEMS Based Integrated Elect, Perlis, Malaysia
[2] Univ Malaysia Perlis, Inst Nano Elect Engn INEE, Perlis, Malaysia
关键词
SU-8; photoresist; softbaking temperature;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the steps required during the fabrication of SU-8 mold for soft lithography is softbaking, which is conducted after the deposition of the photoresist. The purpose of softbaking is to stabilize the resist film and eliminate any remaining solvent through evaporation. This ensures that the resist surface is non-sticking, hence avoiding debris when transferring the patterns later. In this paper, we investigate the effects of softbaking temperature on the polymerization of SU-8 photoresist. The significance of this work is to optimize the fabrication process involved in producing SU-8 mold structures with thickness of 30 mu m. This project involves a series of experiments covering softbaking temperatures ranging from 45 degrees to 115 degrees C. Experiments results show that softbaking temperature of 85 degrees C results in completely stick and crack free structures. By this, a huge improvement obtained if compared to the result of processing at the standard soft bake temperature of 95 degrees C. The soft bake temperature should not be taken lightly while optimizing SU-8 processing because it has a big influence on the material properties and the lithographic performance of the resist.
引用
收藏
页码:467 / 470
页数:4
相关论文
共 50 条
  • [31] Reduction of internal stress in SU-8 photoresist layer by ultrasonic treatment
    DU LiQun1
    2 Key Laboratory for Precision & Non-traditional Machining Technology of Ministry of Education
    Science China(Technological Sciences), 2010, (11) : 3006 - 3013
  • [32] Application of fuzzy neural network in the internal stress of SU-8 photoresist
    Key Laboratory for Precision and Non-Traditional Machining Technology, Dalian University of Technology, Dalian 116023, China
    不详
    Nami Jishu yu Jingmi Gongcheng, 2007, 4 (323-326):
  • [33] Reduction of internal stress in SU-8 photoresist layer by ultrasonic treatment
    Du LiQun
    Wang QiJia
    Zhang XiaoLei
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2010, 53 (11) : 3006 - 3013
  • [34] Development of LIGA-Like Process with Positive Photoresist & SU-8
    Lee, Yongsu
    Kim, Jinha
    Lee, Seokwoo
    Lee, Seungsub
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION (IMECE 2010), VOL 10, 2012, : 155 - 160
  • [35] Reduction of internal stress in SU-8 photoresist layer by ultrasonic treatment
    LiQun Du
    QiJia Wang
    XiaoLei Zhang
    Science China Technological Sciences, 2010, 53 : 3006 - 3013
  • [36] Submillimetre Rectangular Waveguides Based on SU-8 Photoresist Micromachining Technology
    Glynn, David
    He, Tianhao
    Powell, Jeff
    Tian, Yingtao
    Shang, Xiaobang
    Lancaster, Michael J.
    2016 46TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2016, : 1346 - 1349
  • [37] Profile control of SU-8 photoresist using different radiation sources
    Cui, Z
    Jenkins, DWK
    Schneider, A
    McBride, G
    MEMS DESIGN, FABRICATION, CHARACTERIZATION, AND PACKAGING, 2001, 4407 : 119 - 125
  • [38] Fabricating method of SU-8 photoresist conical nozzle for inkjet printhead
    Yi, Maocong
    Feng, Jianbo
    Yin, Zhifu
    Zou, Helin
    MATERIALS AND MANUFACTURING PROCESSES, 2018, 33 (08) : 898 - 904
  • [39] Development of a conductive photoresist with a mixture of SU-8 and HCl doped polyaniline
    Annaiyan, Uma M.
    Kalantar-Zadeh, Kourosh
    Fang, Qiang
    Cosic, Irena
    TENCON 2005 - 2005 IEEE REGION 10 CONFERENCE, VOLS 1-5, 2006, : 170 - +
  • [40] Encapsulation of a liquid-sensing microchip using SU-8 photoresist
    Hammond, PA
    Cumming, DRS
    MICROELECTRONIC ENGINEERING, 2004, 73-4 : 893 - 897