Single crystal synchrotron X-ray diffraction of CuInSe2

被引:0
|
作者
Frolow, F [1 ]
Chernyak, L
Cahen, D
机构
[1] Weizmann Inst Sci, IL-76100 Rehovot, Israel
[2] Bethlehem Univ, Bethlehem, Palestine
[3] European Synchrotron Res Facil, Grenoble, France
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中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The structure of CuInSe2 was redetermined, using synchrotron X-radiation with 0.15 Angstrom wavelength, thus eliminating problems of uncertainties introduced by absorption corrections. This allowed us to look at the effect of subjecting crystals to strong electric fields, a process known to be able to type convert the material under relatively mild conditions. Proper refinement became possible after correcting for twinning. The main results are relatively high Cu temperature factors and significant electron density in octahedral interstitial sites. The main results of electric field application are a decrease in structure quality (increased R factor) and a slight increase in electron density on Cu sites. These preliminary results point to the need for further work with twin-free crystals.
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页码:67 / 70
页数:4
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