Mutation analysis and its industrial applications

被引：0
|
作者：
Gopinath, Rahul [1 ]
Zhang, Jie M. [2 ]
Kintis, Marinos [3 ]
Papadakis, Mike [3 ]
机构：
[1] Univ Sydney, Sydney, NSW, Australia
[2] Kings Coll London, London, England
[3] Univ Luxembourg, SnT, Esch sur Alzette, Luxembourg
来源：
SOFTWARE TESTING VERIFICATION & RELIABILITY | 2022年 / 32卷 / 08期
关键词：
D O I：
10.1002/stvr.1831
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页数：1
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