A novel NURBS surface approach to statistically monitor manufacturing processes with point cloud data

被引:11
|
作者
Wells, Lee J. [1 ]
Dastoorian, Romina [1 ]
Camelio, Jaime A. [2 ]
机构
[1] Western Michigan Univ, Dept Ind & Entrepreneurial Engn & Engn Management, Kalamazoo, MI 49008 USA
[2] Virginia Tech, Grado Dept Ind & Syst Engn, Blacksburg, VA 24061 USA
关键词
High-density measurements; Non-contact scanning systems; NURBS surfaces; Statistical process control; Surface monitoring; CONTROL CHARTS; QUALITY;
D O I
10.1007/s10845-020-01574-1
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
As sensor and measurement technologies advance, there is a continual need to adapt and develop new Statistical Process Control (SPC) techniques to effectively and efficiently take advantage of these new datasets. Currently high-density noncontact measurement technologies, such as 3D laser scanners, are being implemented in industry to rapidly collect point clouds consisting of millions of data points to represent a manufactured parts' surface. For their potential to be realized, SPC methods capable of handling these datasets need to be developed. This paper presents an approach for performing SPC using high-density point clouds. The proposed approach is based on transforming the high-dimensional point clouds into Non-Uniform Rational Basis Spline (NURBS) surfaces. The control parameters for these NURBS surfaces are then monitored using a surface monitoring technique. In this paper point clouds are simulated to determine the performance of the proposed approach under varying fault scenarios.
引用
收藏
页码:329 / 345
页数:17
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