Analysis of spread spectrum time domain reflectometry for wire fault location

被引:243
|
作者
Smith, P [1 ]
Furse, C
Gunther, J
机构
[1] LiveWire Test Labs Inc, VP Technol, Salt Lake City, UT 84117 USA
[2] Univ Utah, Dept Elect & Comp Engn, Salt Lake City, UT 84112 USA
基金
美国国家科学基金会;
关键词
aging wire detection; arc detection; sequence time domain reflectometry (STDR); spread spectrum time domain reflectometry (SSTDR); time domain reflectometry (TDR); wire fault; detection;
D O I
10.1109/JSEN.2005.858964
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spread spectrum time domain reflectometry (SSTDR) and sequence time domain reflectometry have been demonstrated to be effective technologies for locating intermittent faults on aircraft wires carrying typical signals in flight. This paper examines the parameters that control the accuracy, latency, and signal to noise ratio for these methods. Both test methods are shown to be effective for wires carrying ACpower signals, and SSTDR is shown to be particularly effective at testing wires carrying digital signals such as Mil-Std 1553 data. Results are demonstrated for both controlled and uncontrolled impedance cables. The low test signal levels and high noise immunity of these test methods make them well suited to test for intermittent wiring failures such as open circuits, short circuits, and arcs on cables in aircraft in flight.
引用
收藏
页码:1469 / 1478
页数:10
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